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Planar Waveguide Automatic Coupling & Testing System
The planar waveguide automatic coupling and testing system meets both chip coupling and testing requirements simultaneously. It supports coupling testing of different types of planar waveguide devices, with flexible parameter settings and a visualize
Product Introduction
The planar waveguide automatic coupling and testing system meets both chip coupling and testing requirements simultaneously. It supports coupling testing of different types of planar waveguide devices, with flexible parameter settings and a visualized, easy-to-operate interface.
Product Features
- Automatically controls and adjusts the distance and parallelism between the FA and the chip.
- Automatic light alignment of Bar bars and automatic scanning testing.
- Automatically judges test results and displays test data in multiple forms.
Application
Coupling testing of AWG, PLC Splitter, MUX, DMUX, VOA, ICR and other planar waveguide products.
Technical Parameters
| Motorized linear axes | Motorized angular axes | Chip-stage motorized linear axis | Vision system | Peripheral equipment | Coupling software |
|---|---|---|---|---|---|
| X/Y/Z: travel 20 mm, resolution 0.05 μm, repeat ±0.3 μm | θX/θY/θZ: travel ±5°, repeat ±0.003° | Travel 150 mm, repeat ±0.5 μm | Dual vision, 4000 W color CCD, lens optical magnification 0.7X–4.5X | Multi-axis motion controller, high-speed power meter, host, light source, etc. | Automatic coupling, automatic testing, curve display, report output |
Performance Index
| Equipment dimensions | System power supply | Peak power | Power acquisition range | Coupling repeatability | Coupling time |
|---|---|---|---|---|---|
| 1160 × 1100 × 1950 mm | AC220V/50Hz | 1000 W | -70 ~ 10 dBm | < 0.2 dB | < 60 s |
Interface Display
