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Probe Card
Multiple probe quantities and sizes, flexible swing needle forms with multiple probe materials, easy maintenance for both single-layer and multi-layer probes, replaceable single probe suitable for testing various optoelectronic chips
Product Introduction
The probes on the probe card can contact the chip pads to output and input electrical signals, thereby determining the chip’s electrical parameters.
Product Features
- Various probe quantities and sizes with diverse probe materials.
- Flexible probe arrangement: single-layer or multi-layer.
- Easy maintenance; single probes can be replaced.
Application
Testing of various optoelectronic chips.
Technical Parameters
| Type | Probe material | Probe diameter | Tip diameter | Tip length | Probe-to-substrate height | PAD size | Epoxy |
|---|---|---|---|---|---|---|---|
| 16-pin / 32-pin | Tungsten / Beryllium copper | 200 μm | 30 ± 2 μm | 320 ± 10 μm | 3 ± 0.1 mm | 100 μm × 100 μm | H9 |
Can be customized per customer requirements.
