Silicon optical chip automatic coupling testing system
Automatic wafer blue film feeding, automatic detection and sorting, suitable for wafers of different sizes; Chip quick clamping and unloading, automatic loading and unloading; Compatible with horizontal and vertical coupling, the chip and input/output FA are automatically coupled and aligned, with a single coupling time of less than 3 seconds. It can automatically search for light, control the distance between FA and chip (accuracy ± 5 μ m), and achieve multi-channel balance; Automatic power up, the probe array precisely contacts the chip pad array, which can power up a certain channel separately or power up all channels of the chip simultaneously; Compatible with horizontal and vertical coupling, expandable and upgradable for 8-inch wafer testing
Product Introduction
The fully automatic coupling testing system for silicon optical chips can simultaneously meet the requirements of chip coupling and testing. The system supports coupling testing of different types of chips/Bar strips/wafers, with flexible parameter settings, visual interface, and convenient operation. This equipment is suitable for coupling testing of various materials such as silicon optical, thin film lithium niobate, III-V group, etc.
Product Features
Automatic wafer blue film feeding, automatic detection and sorting, suitable for wafers of different sizes; Chip quick clamping and unloading, automatic loading and unloading; Compatible with horizontal and vertical coupling, the chip and input/output FA are automatically coupled and aligned, with a single coupling time of less than 3 seconds. It can automatically search for light, control the distance between FA and chip (accuracy ± 5 μ m), and achieve multi-channel balance; Automatic power up, the probe array precisely contacts the chip pad array, which can power up a certain channel separately or power up all channels of the chip simultaneously; Compatible with horizontal and vertical coupling, expandable and upgradable for 8-inch wafer testing
